Publication

Picture of CI-710s SpectraVue Leaf Spectrometer

CI-710s

SpectraVue Leaf Spectrometer

Prediction accuracy of high-resolution spectral information for nondestructive phenotyping of epicuticular wax in wheat

March 23, 2016
Date March 23rd, 2017
Publication Proceedings of the 3rd International TRIGO Wheat Yield Potential
Authors Fatima Camarillo-Castillo, Maria Tattaris, Dirk B. Hays, Matthew P. Reynolds
Source View
Type Supporting Science